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Nikon VMZ-K3040 & VMZ-K6555 共軛焦影像測量系統介紹

Nikon VMZ-K3040 & VMZ-K6555 共軛焦影像測量系統介紹

Simultaneous wide-area height measurements with confocal optics and 2D measurement with 15× brightfield zoom optics.

  • Main Body (Type /Stage Stroke)
 

VMZ-K3040

VMZ-K6555

Nikon VMZ-K3040 & VMZ-K6555 共軛焦影像測量系統介紹

Nikon VMZ-K3040 & VMZ-K6555 共軛焦影像測量系統介紹

XY Stroke (mm)

300×400

650×550

Magnification (Type S)

1.5× / 3× / 7.5×

1.5× / 3× / 7.5×

Magnification (Type H)

15× / 30×

15× / 30×

Z-axis Stroke (mm)

150

150

Max. guaranteed loading capacity (kg)

20

30

Max. permissible error U1X, U1Y (µm)

1.5+2.5L / 1000

1.5+2.5L / 1000

Max. permissible error of Z axis (µm)

1+L / 1000

1+L / 1000

  • Zoom Heads

Nikon VMZ-K3040 & VMZ-K6555 共軛焦影像測量系統介紹

Confocal NEXIV incorporates confocal optics for fast and accurate evaluation of fine three-dimensional geometries.

Confocal Optics are designed for wide FOV height measurement.
Nikon VMZ-K3040 & VMZ-K6555 共軛焦影像測量系統介紹
  • High Contrast and Multileveled Sample (PCBs)

Brightfield observation can sometimes be difficult due to blurred lines along sample structure. These lines can be clearly observed andmeasured using Confocal optics. 

Nikon VMZ-K3040 & VMZ-K6555 共軛焦影像測量系統介紹

Nikon VMZ-K3040 & VMZ-K6555 共軛焦影像測量系統介紹

  • Thin Transparent Samples (Metal Surface Film / Semiconductor Resist)

Top layers of both thin transparent film and metal surface can be easily detected using Confocal optics.

Nikon VMZ-K3040 & VMZ-K6555 共軛焦影像測量系統介紹

Nikon VMZ-K3040 & VMZ-K6555 共軛焦影像測量系統介紹

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