Nikon VMZ - K3040 & VMZ - K6555 共軛焦影像測量系統
Nikon VMZ - K3040 & VMZ - K6555 共軛焦影像測量系統
Nikon VMZ-K3040 VMZ-K6555 共軛焦影像測量 Simultaneous wide-area height measurements with confocal optics and 2D measurement with 15× brightfield zoom optics

Nikon VMZ - K3040 & VMZ - K6555 共軛焦影像測量系統

Simultaneous wide-area height measurements with confocal optics and 2D measurement with 15× brightfield zoom optics.
Nikon VMZ - K3040 & VMZ - K6555 共軛焦影像測量系統

Zoom Heads

Nikon VMZ - K3040 & VMZ - K6555 共軛焦影像測量系統
Nikon VMZ - K3040 & VMZ - K6555 共軛焦影像測量系統
Confocal NEXIV incorporates confocal optics for fast and accurate evaluation of fine three-dimensional geometries.
Confocal Optics are designed for wide FOV height measurement.

High Contrast and Multileveled Sample (PCBs)

Nikon VMZ - K3040 & VMZ - K6555 共軛焦影像測量系統
Brightfield observation can sometimes be difficult due to blurred lines along sample structure. These lines can be clearly observed and measured using Confocal optics. 
Nikon VMZ - K3040 & VMZ - K6555 共軛焦影像測量系統

Thin Transparent Samples (Metal Surface Film / Semiconductor Resist)

Nikon VMZ - K3040 & VMZ - K6555 共軛焦影像測量系統
Top layers of both thin transparent film and metal surface can be easily detected using Confocal optics.
Nikon VMZ - K3040 & VMZ - K6555 共軛焦影像測量系統
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